IEC 61000-4-4 6kV Intelligent Electrical Fast Transient Generator (EFT)

Standards & Clauses:

IEC 61000-4-4/ GB/T17626.4: Electrical fast transient immunity test

Samples and Restrictions:

Industrial controllers, home appliances, medical electronics, communication electronics, components, automation controllers, etc.

Application:

Intended to demonstrate the immunity of electrical and electronic equipment when subjected to types of transient disturbances such as those originating from switching transients (interruption of inductive loads, relay contact bounce, etc.)

Test Principle:

Burst immunity test is the interference generated by many mechanical switches in the simulation grid when switching inductive load. These types of disturbances are characterized by narrow clusters of pulses with high pulse repetition rates (kHz-MHz), steep rising edges (ns), short durations of individual pulses (10-100 ns) with amplitudes up to kV level. Narrow pulses in clusters can charge the junction capacitance of the semiconductor device, which can cause a line or device error when energy accumulates to a certain degree. During the test, a pulse is superimposed on the power supply line (via the coupling / decoupling network) and the communication line (via the capacitive coupling clip) to interfere with the device. The experimental part of the EUT mainly includes the power supply port, PE, signal and control port of the equipment.

Structure:

7-inch touch LCD interface, rich in functions, easy for operation and upgrading software.

User-programmable test program with up to 1000 sets of memory.

Built-in three-phase five-wire 16A power network, network and host 2 in 1, miniaturized design.

Imported non-inductive high-power resistors are used in the pulse forming circuit to ensure stable pulse waveforms.

The coupling network uses the latest optimization technology, with low attenuation and sufficient output energy.

Built-in temperature and humidity sensor for real-time monitoring of the experimental environment.

EUT output comes with high-strength industrial-grade standard sockets, which is more convenient and reliable.

Intelligent program-controlled high voltage power supply with built-in high voltage overvoltage, overcurrent and short circuit protections.

Self-diagnosis function, intelligent judgment of high voltage, abnormal pulse output.

Use Environment​:

Power supply: 220V±10%, 50/60Hz

Ambient temperature: 5 °C ~ +40 °C, there should be no high concentration of dust, corrosive gas, flammable and explosive objects.

Technical Parameters:

Control & Operation	Electrical control and touch screen intelligent operating system
Open Circuit Output Voltage	0.25-6kV ±5%
50Ω Load Output Voltage	0.125-3kV ±5%
Pulse Waveform	5/50ns, 50Ω and 1000Ω load
Rise Time tr	5ns ±30%, 50Ω load
	5ns ±30%, 1000Ω load
Pulse Duration td	50ns ±30%, 50Ω load
	50ns -15/+100sn, 1000Ω load
Source Impedance	50Ω ±20%
Output Polarity	Positive, negative, positive and negative cycles, positive and negative alternating, first positive and then negative, first negative and then positive
Pulse Repetition Frequency	0.1-1200.0kHz ±10%
Burst Length	Standard: 15ms@2.5kHz/5kHz, 750μs@100kHz, 250μs@300kHz
	Adjustable: the number of pulses can be selected from 1 to 255 Burst length = (number of pulses - 1) / pulse repetition frequency
Burst Period	100－999ms
Trigger Mode	Synchronous or asynchronous
Synchronous Phase	Free setting 0-360°, resolution 1°
Programmable Test Program	Built-in IEC standard and user-defined programs, up to 1000 groups
Built-in Network Capacity (three phases and five lines)	AC, three-phase 380V, 16A (Max), 50/60Hz
	DC, 380V, 16A (Max)
Built-in Network Coupling Method	L1, L2, L3, N, PE, can be combined
Built-in Network Coupling Device	33nF ±10% capacitive coupling
Use environment	Temperature: 15 ° C -35 ° C, relative humidity: 10% -75%
System Power	AC220±10%, 50/60Hz, about 300W
Dimensions	W 470mm * H 215mm * D 500mm
Weight	About 25kg
Output Waveform Diagram
Measured Waveform	4.8kV 50Ω load output waveform(1000:1)
	4.8kV 1000Ω load output waveform(1000:1)
Test Configuration Layout