IEC60884-1 Clause 30.1 Figure 41 High Temperature Indentation Device
IEC60884-1 Clause 30.1 Figure 41 High Temperature Indentation Device
- Model：
IEC60884-1 Clause 30.1 Figure 41 High Temperature Indentation Device
Standard:IEC60884-1-2002 clause 30.1 figure 41,IEC60598- 2-20 clause 20.15, EN60811-3-1 insulating and sheathing materials of electric and optical cables-common test methods.
Application:For PVC insulated and sheathed wire and cable products, measure resistance to thermal deformation of PVC insulated and sheathed under the action of thermal and mechanical load, the insulation wire to be measured can be round, fan-shaped and parallel cord, the sheathed to be measured can be round or flat. It is not recommended to use this test method when the thickness of the test sample (Insulation or sheath) less than 0.4MM.
Test sample:PVC insulated and sheathed wire and cable products.
Technical parameters:
| Working station | Two stations |
| Blade width | 0.70±0.01mm |
| Sample support plane | 0°,90°,120° one piece per each,can replaceable use |
| Support | Smooth stainless steel support |
| The load weight is composed of a rectangular knife + weight +tray), rectangular knife and tray are 120g, and equip with two sets of a standard weight of 1~1kg. | |
The specimens are tested by means of the apparatus shown in figure 41. This apparatus has a rectangular blade (see figure 41a) with an edge 0.7 mm wide, to be used in the case of round pins, or a blade having a round shape (see figure 41 b), with a diameter of 6 mm and an edge of 0.7 mm, in other cases.
The specimens are placed in position as shown in figure 41. The force applied through the blade is 2.5 N. The apparatus, with the specimen in position, is maintained for 2 h in a heating cabinet at a temperature of (200±5)℃.
The specimen is then removed from the apparatus and, within 10 s, cooled by immersion in cold water. The thickness of the insulation remaining at the point of impression is measured and shall not have been reduced by more than 50% of its original value measured at the start of the test.
